Work

Advanced Process Defect Monitoring Model and Prediction Improvement by Artificial Neural Network in Kitchen Manufacturing Industry: a Case of Study

Year: 2019

Type: conference-paper

Source: IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)

DOI: 10.1109/metroi4.2019.8792872

Authors: Alessandro Massaro, Ivano Manfredonia, Angelo Galiano, Benny Xhahysa

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2967328670

FWCI: 9.507

Cites: 17

Cited by: 21

Related to: 10