Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification
Year: 2018
Type: article
Abstract: Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light‐induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.
Source: Nanophotonics
Institution: University of Illinois Urbana-Champaign
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,995
OpenAlex ID: W2974178045