Development of a naive bayes classifier for image quality assessment in biometric face images
Year: 2019
Type: conference-paper
Authors: Armando M. Gutiérrez, Patricia A. Pacheco, José C. Gutiérrez, Graça Bressan
Institution: Universidade de São Paulo
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2979785697
