Year: 2019
Type: article
Abstract: EBSD in combination with aberration-corrected STEM is used to study the interfacial layer forming at Ni electrode - PbTe thermoelectric material interfaces. Contrary to previous studies, both orthorhombic and monoclinic phases are identified within the interfacial layer. EBSD and STEM data at interphase boundaries demonstrate an approximately smooth transition from orthorhombic to monoclinic phase with almost no crystal defects due to the small differences in lattice parameters and the prevalence of one of two previously unknown orientation relationships between the phases. Moreover, the presence of special boundaries resulting in orientation domains within both phases throughout the interfacial nickel telluride layer needs to be considered when fabricating future thermoelectric devices.
Source: Materials & Design
Institutions: University of Wollongong, Sheffield Hallam University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,700
Awards: New generation high efficiency thermoelectric materials and modules for waste heat recovery in steelworks, G3321377349, An aberration corrected analytical Transmission Electron Microscope for nanoscale characterisation of materials, G5358191832, An analytical field emission gun scanning electron microscope, Focused ion beam microscope for trace element analysis and nanomachining, Nano-engineered, cost-effective lead chalcogenides to boost the performance of mid-range temperature thermoelectric materials
OpenAlex ID: W2980148061