Work

Intrinsic sensitivity of Cd/sub 1-x/Zn/sub x/Te semiconductors for digital radiographic imaging

Year: 2003

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/tim.2003.818563

Authors: G.C. Giakos, R. Guntupalli, J.A. De Abreu-Garcia, N. Shah, S. Vedantham, S. Suryanarayanan, S. Chowdhury, N. Patnekar, S. Sumrain, K. Mehta, E. Evans, A. Orozco, V. Kumar, O. Ugweje, A. Moholkar

Institution: University of Akron

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2988331999

FWCI:

Cites: 65

Cited by: 1

Related to: 10