Work

Electrothermal Effects on Reliability of Vertical Resistive Random Access Memory Array by Parallel Computing

Year: 2019

Type: conference-paper

Source: International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

DOI: 10.1109/emccompo.2019.8919912

Authors: Hao Xie, Guodong Zhu, Xingxing Xu, Shuo Zhang, Wen-Yan Yin, Wenchao Chen, Yazhou Chen, Jixin Chen

Institution: Zhejiang University

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2993948348

FWCI:

Cites: 18

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Related to: 10