Work

More Data Can Hurt for Linear Regression: Sample-wise Double Descent

Year: 2019
Type: preprint
Abstract: In this expository note we describe a surprising phenomenon in overparameterized linear regression, where the dimension exceeds the number of samples: there is a regime where the test risk of the estimator found by gradient descent increases with additional samples. In other words, more data actually hurts the estimator. This behavior is implicit in a recent line of theoretical works analyzing "double-descent" phenomenon in linear models. In this note, we isolate and understand this behavior in an extremely simple setting: linear regression with isotropic Gaussian covariates. In particular, this occurs due to an unconventional type of bias-variance tradeoff in the overparameterized regime: the bias decreases with more samples, but variance increases.
Language: English
Open Access status: green
OpenAlex ID: W2996360471
Cites: 12
Cited by: 35
Related to: 10