Thickness-dependent charge transport in exfoliated indium selenide vertical field-effect transistors
Year: 2019
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.5128808
Authors: Vinod K. Sangwan, Junmo Kang, Mark C. Hersam
Institution: Northwestern University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
Funder: National Science Foundation
OpenAlex ID: W2996426802