Quantitative investigation of charge-trapping effects on Raman spectra acquired using charge-coupled device (CCD) detectors
Year: 1991
Type: article
Source: CTIT technical reports series
Authors: W. B. Lacey, Kathy L. Rowlen, Joel M. Harris
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2996462493