Work

Patent Value Analysis Using Deep Learning Models—The Case of IoT Technology Mining for the Manufacturing Industry

Year: 2019

Type: article

Source: IEEE Transactions on Engineering Management

DOI: 10.1109/tem.2019.2957842

Authors: Amy J. C. Trappey, Charles V. Trappey, Usharani Hareesh Govindarajan, John J. H. Sun

Institutions: National Tsing Hua University, Shanghai Jiao Tong University

Language: English

Topic: Intellectual Property and Patents

Subfield: Management of Technology and Innovation

Field: Business, Management and Accounting

Domain: Social Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Ministry of Science and Technology, Taiwan

Awards: A Trademark Infringement Ontology and Intelligent Case Recommendation System for Brand Protection and Digital Marketing, Using Unsupervised Machine Learning Approach to Develop Intelligent Patent Topic E-Discovery

OpenAlex ID: W2997071385

FWCI: 9.25

Cites: 40

Cited by: 98

Related to: 10