Work

Modeling and Demonstration of Oxygen Vacancy-Based RRAM as Probabilistic Device for Sequence Learning

Year: 2019

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2019.2957067

Authors: Jonas Doevenspeck, Robin Degraeve, Andrea Fantini, Peter Debacker, Diederik Verkest, Rudy Lauwereins, Wim Dehaene

Institutions: IMEC, KU Leuven

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Interuniversitair Micro-Electronica Centrum VZW

OpenAlex ID: W2997278039

FWCI:

Cites: 18

Cited by: 2

Related to: 10