Work

Development of Edge-based Deep Learning Prediction Model for Defect Prediction in Manufacturing Process

Year: 2019

Type: conference-paper

Source: International Conference on Information and Communication Technology Convergence (ICTC)

DOI: 10.1109/ictc46691.2019.8939905

Authors: Kyung-Taek Lee, Youn-Sung Lee, Hyoseok Yoon

Institutions: Korea Electronics Technology Institute, Hanshin University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2998463550

FWCI: 1.865

Cites: 2

Cited by: 7

Related to: 10