Work

Optimal designs and reliability sampling plans for one-shot devices with cost considerations

Year: 2020

Type: article

Source: Reliability Engineering & System Safety

DOI: 10.1016/j.ress.2020.106795

Authors: Shuo-Jye Wu, Chu-Chun Hsu, Syuan-Rong Huang

Institutions: Tamkang University, Vanguard International Semiconductor (Taiwan)

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Ministry of Science and Technology of the People's Republic of China, Ministry of Science and Technology, Taiwan

Awards: G258176310, Reliability Analysis for One-Shot Device Accelerated Life Testing

OpenAlex ID: W3000412064

FWCI: 3.329

Cites: 38

Cited by: 32

Related to: 10