Work

Surface microstructure and optical properties of PbTe films on semiconductor and dielectric substrates

Year: 2010

Type: article

Abstract: PbTe thin films on silicon, germanium, micaceous and glassy substrates, as well as on silica substrates coated with SiO 2 -, GeO 2 -, and HfO 2 -gel films, were prepared by means of precipitation from the gas-dynamical vapor stream.The microstructure of the film surface and optical properties in the middle IR-range as a function of the conditions of preparation and the nature of the substrate were investigated by means of scanning electron microscopy and FTIR spectroscopy.Analysis of physical properties of the substrates allowed us to deduce a correlation between the thermal conductivity of the substrate and characteristics of PbTe films prepared under the same conditions.Surface microstructure / FTIR spectroscopy / SEM / Thin films

Source: Chemistry of Metals and Alloys

DOI: 10.30970/cma3.0133

Authors: A.N. HARBACHOVA, G.E. MALASHKEVICH, D.M. FREIK, R.I. NYKYRUY, G.P. SHEVCHENKO

Institutions: National Academy of Sciences of Belarus, Lviv University, B.I. Stepanov Institute of Physics, Vasyl Stefanyk Carpathian National University, Belarusian State University

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: bronze

Funder: Belarusian Republican Foundation for Fundamental Research

OpenAlex ID: W3002291214

FWCI:

Cites:

Cited by: 3

Related to: 10