Work

Nanoscale Potentiometry and Spectroscopy of Organic Electronic and Photonic Materials and Devices using Conductive Atomic Force Microscopy

Year: 2002

Type: article

Source: APS

Authors: Mark C. Hersam, E. F. Fabbroni, Matthew W. Such, Kenneth R. Shull, J. G. C. Veinot, Tobin J. Marks

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3002491810

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