Work

Generation and Termination of Stacking Faults by Inverted Domain Boundaries in 3C-SiC

Year: 2020

Type: article

Source: Crystal Growth & Design

DOI: 10.1021/acs.cgd.9b01708

Authors: Massimo Zimbone, Eric Gasparo Barbagiovanni, Corrado Bongiorno, Cristiano Calabretta, Lucia Calcagno, Giuseppe Fisicaro, Antonino La Magna, Francesco La Via

Institutions: Institute for Microelectronics and Microsystems, STMicroelectronics (Italy), University of Messina, University of Catania

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: H2020 Industrial Leadership

Award: G4362228929

OpenAlex ID: W3011228094

FWCI: 1.181

Cites: 54

Cited by: 20

Related to: 10