Work

Observation of dislocations in β -Ga 2 O 3 single-crystal substrates by synchrotron X-ray topography, chemical etching, and transmission electron microscopy

Year: 2020

Type: article

Source: Japanese Journal of Applied Physics

DOI: 10.35848/1347-4065/ab7dda

Authors: Yongzhao Yao, Yoshihiro Sugawara, Yukari Ishikawa

Institution: Japan Fine Ceramics Center

Language: English

Topic: Ga2O3 and related materials

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: Japan Society for the Promotion of Science

Award: Effects of defects and surface structure on oxide film on non-polar 4H-SiC plane

OpenAlex ID: W3012326286

FWCI: 3.445

Cites: 69

Cited by: 34

Related to: 10