Work

Code Nano-Pattern Detection using Deep Learning

Year: 2020

Type: conference-paper

Source: Innovations in Software Engineering Conference (ISEC)

DOI: 10.1145/3385032.3385050

Authors: Anubhav Trivedi, Jitendra Singh Thakur, Atul Gupta

Institutions: Jabalpur Engineering College, Indian Institute of Information Technology Design and Manufacturing Jabalpur

Language: English

Topic: Software Engineering Research

Subfield: Information Systems

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3013034638

FWCI: 0.319

Cites: 6

Cited by: 3

Related to: 10