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Electron energy loss spectroscopy (EELS) by scanning transmission electron microscopy (STEM) at low doses

Year: 1987

Type: article

Source: Proceedings annual meeting Electron Microscopy Society of America

DOI: 10.1017/s0424820100125518

Authors: R. Reichelt, A. Engel, R. Leapman

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W3036300085

FWCI:

Cites: 5

Cited by: 1

Related to: 10