Work

Analysis of Image Contrast in High-Resolution Images of n-Paraffin Recorded at 400 kV and -167°C

Year: 1990

Type: article

Source: Proceedings annual meeting Electron Microscopy Society of America

DOI: 10.1017/s042482010017918x

Authors: J. Brink, W. Chiu

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W3036796028

FWCI:

Cites: 5

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Related to: 10