Work

Zero-Shot Learning in the Presence of Hierarchically Coarsened Labels

Year: 2020

Type: conference-paper

Source: IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

DOI: 10.1109/cvprw50498.2020.00471

Authors: Colin Samplawski, Erik Learned-Miller, Heesung Kwon, Benjamin M. Marlin

Institutions: University of Massachusetts Amherst, United States Army

Language: English

Topic: Domain Adaptation and Few-Shot Learning

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3036858000

FWCI: 0.377

Cites: 17

Cited by: 6

Related to: 10