Work

Resolution assessment from spectral signal-to-noise ratios

Year: 1987

Type: article

Source: Proceedings annual meeting Electron Microscopy Society of America

DOI: 10.1017/s0424820100128043

Authors: M. Unser, B.L. Trus, A.C. Steven

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W3036970724

FWCI:

Cites: 5

Cited by: 1

Related to: 10