Work

Learning Distance Metrics from Probabilistic Information

Year: 2020

Type: article

Source: ACM Transactions on Knowledge Discovery from Data

DOI: 10.1145/3364320

Authors: Mengdi Huai, Chenglin Miao, Yaliang Li, Qiuling Suo, Lu Su, Aidong Zhang

Institutions: University of Virginia, University at Buffalo, State University of New York

Language: English

Topic: Face and Expression Recognition

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Youth Science Foundation

Award: G7150224088

OpenAlex ID: W3038711713

FWCI: 1.126

Cites: 32

Cited by: 14

Related to: 10