Work

Patch based vulnerability matching for binary programs

Year: 2020

Type: conference-paper

Source: ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA)

DOI: 10.1145/3395363.3397361

Authors: Yifei Xu, Zhengzi Xu, Bihuan Chen, Fu Song, Yang Liu, Ting Liu

Institutions: Xi'an Jiaotong University, Nanyang Technological University, Fudan University, ShanghaiTech University, Zhejiang University

Language: English

Topic: Security and Verification in Computing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3043519510

FWCI: 5.739

Cites: 43

Cited by: 95

Related to: 10