Data-driven fault diagnosis for chemical processes using transfer entropy and graphical lasso
Year: 2020
Type: article
Source: Computers & Chemical Engineering
Authors: Hodong Lee, Changsoo Kim, Sanha Lim, Jong Min Lee
Institution: Seoul National University
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W3049281408