Work

Deep learning-enabled resolution enhancement of scanning electron microscopy images

Year: 2020

Type: conference-paper

Source: Emerging Topics in Artificial Intelligence (ETAI)

DOI: 10.1117/12.2567504

Authors: Kevin de Haan, Zachary S. Ballard, Yair Rivenson, Yichen Wu, Aydogan Ozcan

Institution: University of California, Los Angeles

Language: English

Topic: Advanced Image Processing Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3080359019

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