Measurement of the Temperature Dependence of the Piezoresistive Coefficients of 4H Silicon Carbide
Year: 2020
Type: conference-paper
Authors: Jun Chen, Jeffrey C. Suhling, Richard C. Jaeger
Institution: Auburn University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W3085093027