Work

Resolution Enhancement in Scanning Electron Microscopy using Deep Learning

Year: 2020

Type: conference-paper

Source: Conference on Lasers and Electro-Optics

DOI: 10.1364/cleo_si.2020.sth1m.5

Authors: Kevin de Haan, Zachary S. Ballard, Yair Rivenson, Yichen Wu, Aydogan Ozcan

Institutions: California NanoSystems Institute, University of California, Los Angeles

Language: English

Topic: Advanced Image Processing Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3086110047

FWCI: 0.763

Cites: 7

Cited by: 11

Related to: 10