Work

Denoising atomic resolution 4D scanning transmission electron microscopy data with tensor singular value decomposition

Year: 2020

Type: article

Source: Ultramicroscopy

DOI: 10.1016/j.ultramic.2020.113123

Authors: Chenyu Zhang, Rungang Han, Anru R. Zhang, Paul.M. Voyles

Institution: University of Wisconsin–Madison

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: bronze

Funders: National Science Foundation, U.S. Department of Energy, National Institutes of Health, Materials Research Science and Engineering Center, Harvard University, Division of Materials Research, Basic Energy Sciences

Awards: G1332609563, Dimension reduction for high-dimensional high-order data, G222768804, CHARACTERIZATION OF DOPANT / POINT DEFECT COMPLEXES IN SEMICONDUCTORS BY STEM, G2871485618, CHARACTERZATION OF DOPANT/ POINT DEFECT COMPLEXES IN SEMICONDUCTORS BY STEM, G3189736496, CAREER: Inference for High-Dimensional Structures via Subspace Learning: Statistics, Computation, and Beyond, G5526312502, G5648016710, Wisconsin Materials Research Science and Engineering Center, G6671297155, G7458958076, G9000073225

OpenAlex ID: W3089098577

FWCI: 2.241

Cites: 74

Cited by: 38

Related to: 10