Reliable estimation of Raman shift and its uncertainty for a non‐doped Si substrate (NMIJ CRM 5606‐a)
Year: 2020
Type: article
Source: Journal of Raman Spectroscopy
DOI: 10.1002/jrs.6003
Authors: Nobuyasu Itoh, Katsuhiro Shirono
Language: English
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W3089446701