Impact of Process Variability on Write Error Rate and Read Disturbance in STT-MRAM Devices
Year: 2020
Type: article
Source: IEEE Transactions on Magnetics
Authors: Jeehwan Song, Hemant Dixit, Behtash Behin-Aein, Chris H. Kim, William Taylor
Institutions: University of Minnesota, GlobalFoundries (United States)
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
Funder: GlobalFoundries
OpenAlex ID: W3090694869