Genetic Diagnosis of Dravet Syndrome Using Next Generation Sequencing-Based Epilepsy Gene Panel Testing.
Year: 2020
Type: article
Source: PubMed
Authors: Jiwon Lee, Chung Lee, Woong-Yang Park, Jeehun Lee
Institutions: Samsung Medical Center, Sungkyunkwan University
Language: English
Subfield: Psychiatry and Mental health
Field: Medicine
Domain: Health Sciences
Open Access status: closed
OpenAlex ID: W3092689911
