Numerical Simulations and In Situ Optical Microscopy Connecting Flow Pattern, Crystallization, and Thin‐Film Properties for Organic Transistors with Superior Device‐to‐Device Uniformity
Year: 2020
Type: article
Source: Advanced Materials
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W3094189164
