Work

Soft errors in DNN accelerators: A comprehensive review

Year: 2020

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2020.113969

Authors: Younis Ibrahim, Haibin Wang, Junyang Liu, Jinghe Wei, Li Chen, Paolo Rech, Khalid Adam, Gang Guo

Institutions: Hohai University, China Institute of Atomic Energy, China Electronics Technology Group Corporation, University of Saskatchewan, Universidade Federal do Rio Grande do Sul, Universiti Malaysia Pahang Al-Sultan Abdullah

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: China Institute of Atomic Energy, Fundamental Research Funds for the Central Universities

Awards: G4653081378, G4940871171

OpenAlex ID: W3096295711

FWCI: 4.213

Cites: 139

Cited by: 108

Related to: 10