Automatic Modeling of Logic Device Performance Based on Machine Learning and Explainable AI
Year: 2020
Type: conference-paper
Authors: Seungju Kim, Kwangseok Lee, Hyeon-Kyun Noh, Youngkyu Shin, Kyu-Baik Chang, Jaehoon Jeong, Sangwon Baek, Myunggil Kang, Keunhwi Cho, Dong-Won Kim, Daesin Kim
Institution: Samsung Electronics (South Korea)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W3096799242
