Work

A method to quantitatively evaluate Hamaker constant using the jump-into-contact effect in Atomic Force microscopy

Year: 2012

Type: preprint

Authors: Soma Das, P. A. Sreeram, A. K. Raychaudhuri

Institution: S.N. Bose National Centre for Basic Sciences

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3101589100

Cites: 31

Cited by: 53

Related to: 10