Optical loss and lasing characteristics of high-quality-factor AlGaAs microdisk resonators with embedded quantum dots
Year: 2005
Type: article
Abstract: Optical characterization of AlGaAs microdisk resonant cavities with a quantum dot active region is presented. Direct passive measurement of the optical loss within AlGaAs microdisk resonant structures embedded with InAs∕InGaAs dots-in-a-well (DWELL) is performed using an optical-fiber-based probing technique at a wavelength (λ∼1.4μm) that is red detuned from the dot emission wavelength (λ∼1.2μm). Measurements in the 1.4μm wavelength band on microdisks of diameter D=4.5μm show that these structures support modes with cold-cavity quality factors as high as 3.6×105. DWELL-containing microdisks are then studied through optical pumping at room temperature. Pulsed lasing at λ∼1.2μm is seen for cavities containing a single layer of InAs dots, with threshold values of ∼17μW, approaching the estimated material transparency level. Room-temperature continuous-wave operation is also observed.
Source: Applied Physics Letters
DOI: 10.1063/1.1901810
Authors: Kartik Srinivasan, Matthew Borselli, Thomas J. Johnson, Paul E. Barclay, Oskar Painter, Andreas Stintz, Sanjay Krishna
Institutions: California Institute of Technology, University of New Mexico
Language: English
Topic: Photonic and Optical Devices
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W1994031904