Year: 2010
Type: article
Abstract: Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical constants of graphene in the visible range with high lateral resolution. In this way, the influence of the substrate on graphene’s optical properties can be investigated.
Source: Applied Physics Letters
DOI: 10.1063/1.3524226
Authors: Ulrich Wurstbauer, Christian Röling, Ursula Wurstbauer, Werner Wegscheider, Matthias Vaupel, Peter H. Thiesen, Dieter Weiss
Institution: University of Regensburg
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W1990211860