The theoretical calibration coefficient in the measurement of nonlinear dielectric constant with a scanning tip microwave near-field microscopy
Year: 2003
Type: article
Abstract: In this paper,the interactions between the tip of the scanning tip microwave near-field microscopy and the nonlinear dielectric material were analyzed.The theoretical calibration coefficient in the measurement of nonlinear dielectric constant as a function of dielectric constant was obtained.The contributions to the coefficient from different directions and the resolution limit were also discussed.
Source: Acta Physica Sinica
Authors: Liu Xue-Rong, Hu Bo, Liu Wen-Han, Gao Chen, 中国科学技术大学物理系，合肥 230026;中国科学技术大学国家同步辐射实验室，合肥 230026
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
OpenAlex ID: W3111962083