Work

A Novel X-Ray Microtomography System with High Resolution and Throughput for Non-Destructive 3D Imaging of Advanced Packages

Year: 2004

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2004p0094

Authors: David Scott, Fred Duewer, Shashi Kamath, Alan Lyon, David Trapp, Steve Wang, Wenbing Yun

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3115980960

FWCI: 0.875

Cites:

Cited by: 8

Related to: 10