Patents, R&D and lag effects: evidence from flexible methods for count panel data on manufacturing firms
Year: 2008
Type: article
Source: Empirical Economics
Authors: Shiferaw Gurmu, Fidel Pérez-Sebastián
Institutions: Georgia State University, University of Alicante
Language: English
Subfield: Management of Technology and Innovation
Domain: Social Sciences
Open Access status: green
OpenAlex ID: W3122267474