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Unit Testing Framework for Embedded Component Systems
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Year:
2020
Type:
conference-paper
Source:
IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC)
DOI:
10.1109/euc50751.2020.00013
Authors:
Shuichiro Morisaki,
Seito Shirata,
Hiroshi Oyama,
Takuya Azumi
Institutions:
Saitama University,
The University of Osaka,
Okuma Corporation (Japan)
Language:
English
Topic:
Software Testing and Debugging Techniques
Subfield:
Software
Field:
Computer Science
Domain:
Physical Sciences
SDG:
Industry, innovation and infrastructure
Open Access status:
closed
OpenAlex ID:
W3130567968
FWCI:
0.489
Cites:
15
Cited by:
5
Related to:
10