Work

Addressing Failure Analysis Challenges in Advanced Packages and MEMS using a Novel Phase and Darkfield X-Ray Imaging System

Year: 2020

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2020p0079

Authors: S.H. Lau, Sheraz Gul, Guibin Zan, David Vine, Sylvia Lewis, Wenbing Yun

Institutions: Sigray (United States), Stanford University

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3133036179

FWCI: 1.937

Cites: 10

Cited by: 2

Related to: 10