Work

In situ Raman spectroscopy of topological insulator Bi2Te3 films with varying thickness

Year: 2013

Type: article

Source: Nano Research

DOI: 10.1007/s12274-013-0344-4

Authors: Chunxiao Wang, Xiegang Zhu, Louis Nilsson, Jing Wen, Guang Wang, Xinyan Shan, Qing Zhang, Shulin Zhang, Jinfeng Jia, Qikun Xue

Institutions: Peking University, State Key Laboratory of Low-Dimensional Quantum Physics, Tsinghua University, Aarhus University, Shanghai Jiao Tong University

Language: English

Topic: Topological Materials and Phenomena

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2112975276

FWCI: 2.389

Cites: 21

Cited by: 102

Related to: 10