Work

Radiation-induced soft errors in advanced semiconductor technologies

Year: 2005

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2005.853449

Author: R.C. Baumann

Institution: Texas Instruments (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2099569658

FWCI: 27.67

Cites: 48

Cited by: 1,606

Related to: 10