Work

Machine learning approach for automated optical inspection of electronic components

Year: 2019

Type: dissertation

Author: Siew Kee Lim

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W3149631139

Cites: 7

Cited by:

Related to: 10