Work

Reliability test results of PCB soldered GaN GIT devices

Year: 2019

Type: conference-paper

Source: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management (PCIM Europe)

Authors: Roman Boldyrjew-Mast, Danny Kretzschmar, Jörg Franke, Josef Lutz

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W3164487648

FWCI: 1.58

Cites:

Cited by: 5

Related to: 10