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OMH3075 Hall Effect Sensor Total Ionizing Dose Test Report

Year: 2019

Type: conference-abstract

Source: NASA Technical Reports Server (NASA)

Authors: James D. Forney, Michael J. Campola

Institutions: Science Systems and Applications (United States), Goddard Space Flight Center

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3167798359

Cites:

Cited by: 1

Related to: 10