Work

Trends in SiC MOSFET Threshold Voltage and ON-Resistance Measurements from Thermal Cycling and Electrical Switching Stresses

Year: 2018

Type: article

Authors: Joseph P. Kozak, Douglas DeVoto, Joshua Major, Khai D. T. Ngo

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W3184030968

FWCI: 1.155

Cites:

Cited by: 15

Related to: 10