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Total Ionizing Dose Test Report for the SFT2222A NPN Bipolar Junction Transistor

Year: 2021

Type: article

Source: NASA Technical Reports Server (NASA)

Authors: Dakai Chen, James D. Forney

Institutions: Goddard Space Flight Center, MEI Technologies (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W3186519523

FWCI:

Cites:

Cited by: 1

Related to: 10